Methods- and Componentdevelopment (e.g. scanning probe procedure for technical samples, combination-evaporate- and analysischambers, inverse photoemission, electrical measurement in UHV, methods for studying "wet" interfaces)
Fundamental research in analytics (e.g. photoemission with small charge carrier agility samples, comparison HREELS -- UV/Vis, dynamic measurement of contactangle)
Error analysis and optimation of technical samples
